Press Releases

VEECO INSTRUMENTS

21 Sep 2009

Veeco Introduces NPFLEX 3D Metrology System Rapid, Three-Dimensional Surface Characterization for Large Samples

Plainview, NY, September 21, 2009 -- Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and
industrial metrology, today announced the release of its NPFLEX™ 3D Metrology System for
characterizing surfaces previously too difficult to measure due to size or part orientation. The NPFLEX
combines the industry-leading performance of Veeco’s non-contact, white light optical profilers with a
unique open-access design to enable rapid, three-dimensional data acquisition and analysis on a wide
range of large samples for precision machining applications in the medical implant, aerospace, and
automotive market sectors.
“Veeco has responded to an unfulfilled need for rapid surface texture measurements of large precision
machined parts,” said Mark R. Munch, Ph.D., Executive Vice President, Veeco Metrology. “The
NPFLEX is capable of performing the critical measurements necessary to guide manufacturers’ decisionmaking
processes throughout the entire production cycle, from R&D through failure analysis.”
Andrew Masters, Veeco’s Vice President of Segment Marketing and Business Development, added, “The
large sample capability of the NPFLEX provides precision machining manufacturers the ability to conduct
true non-contact, non-destructive analysis of larger form factors with tight tolerances. Customers now
have at their disposal the extensive surface characterization abilities necessary to refine their processes
and products in the real world manufacturing environment.”
About the NPFLEX
The NPFLEX utilizes a break-through gantry design to provide over 300 degrees of access for large
samples. The unique option of a swiveling optical head permits routine investigation of highly curved
samples and beveled edges. The system’s white light interferometric technology provides greater
accuracy, repeatability and, more importantly, data density than is possible with contact instrumentation.
Other standard features include long working distance objectives, a proprietary objective crash-mitigation
system, automation and field-stitching software, and patent-pending, ultra-uniform dual-LED
illumination. Running on the industry-leading Vision® software platform, the NPFLEX provides access to
over 200 distinct analyses, and over 1000 critical parameters for measuring curvature, lay, bearing ratio,
wear, corrosion, and other critical parameters.
About Veeco
Veeco Instruments Inc. manufactures enabling solutions for customers in the HB-LED, solar, data storage,
semiconductor, scientific research and industrial markets. We have leading technology positions in our
three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology
Instruments. Veeco’s manufacturing and engineering facilities are located in New York, New Jersey,
California, Colorado, Arizona, Minnesota and Massachusetts. Global sales and service offices are located
throughout the U.S., Europe, Japan and APAC. http://www.veeco.com/
To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are
forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from
the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and
Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2008 and in our subsequent quarterly
reports on Form 10-Q, current reports on Form 8-K and press releases. Veeco does not undertake any obligation to update any
forward-looking statements to reflect future events or circumstances after the date of such statements.

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